ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,687, issued on April 14, was assigned to FTH S.r.L. (Rovereto, Italy). "Optoelectronic device for the detection of substances dispersed in... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,688, issued on April 14, was assigned to The Trustees of Columbia University in the City of New York (New York) and Barnard College (New Yo... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,689, issued on April 14, was assigned to Advanced Semiconductor Engineering Inc. (Kaohsiung, Taiwan). "Electronic package having humidity ... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,690, issued on April 14, was assigned to SARINE TECHNOLOGIES LTD. (Israel). "System and method for grading clarity of gemstones" was inven... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,691, issued on April 14, was assigned to Asahi Kasei Battery Separator Corp. (Tokyo). "Method for manufacturing separator for electrical s... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,692, issued on April 14, was assigned to The Boeing Co. (Arlington, Va.). "Systems and methods for detecting foreign object debris within ... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,693, issued on April 14, was assigned to United States of America as represented by the Administrator of NASA (Washington). "Astronomy rec... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,694, issued on April 14, was assigned to GE Precision Healthcare LLC (Waukesha, Wis.). "System and method for improved data handling in a ... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,695, issued on April 14, was assigned to Sesotec GmbH (Schonberg, Germany). "Method for measuring the detection sensitivity of an X-ray de... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,696, issued on April 14, was assigned to Rigaku Corp. (Akishima, Japan). "Crystal structure analysis method, crystal structure analysis de... Read More